V.3 No 1 |
79 |
Several experiments studying dynamic magnetic field | |
3.2. Description of
experimental device
To check this peculiarity, we used the ferromagnetic core
with a plane gap |
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Fig. 11. Experimental device checking the process of emf induction in a single conductor in a local homogeneous magnetic field |
The cross-section of the gap is 32 Such design of frame has been chosen in order to compensate the supposed parasitic emf able to arise when the probe leg has been put into the gap of core. The further study with different kinds of frames showed this precaution excessive. |
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Fig. 12. Design of probe frame for the experiment studying the process of induction in a single wire
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To diminish the parasitic affection of the primary winding onto the bypass wires of frame, we conducted the experiment at low frequency - 50 Hz. The electric circuit of the experimental device is shown in Fig. 13. |
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Fig. 13. The electric circuit of the experimental device for studying the process of induction in a single wire |
The circuit consisted of autotransformer 1 used to vary the voltage across the primary windings. To the output of the autotransformer we connected the primary windings 2 connected in parallel. We picked the signal off the frame 3 and by the amplifier having kamp = 200 and Rin = 1 MOhm we applied it to the Y input of oscillograph whose start was synchronised with the voltage across the primary windings 2. When preparing the experiment, we additionally have checked, how the parasitic emf affected the tapping parts of frame. To do so, we have put into the device the frame without the central leg. We have revealed that the parasitic affection is at the level of noise and practically does not effect on the value of measured emf induced in the probe. |
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